| IEC 60410 Ed. 1.0 b:1973, Sampling plans and procedures for inspection by attributes |  | Author: IEC TC/SC 56
Publisher: Multiple. Distributed through American National Standards Institute (ANSI)
Category: Book
Buy New: $199.00
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Language: English (Published)
Media: Paperback
Pages: 86
Shipping Weight (lbs): 0.6
Dimensions (in): 10.5 x 8.3 x 0.2
ASIN: B000XYS2GW
Publication Date: August 19, 2007
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Product Description
Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations, materials in process, supplies in storage, maintenance operations, data or records and administrative procedures.
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